The Cadence Voltus-XFi customized electromigration and IR drop (EM-IR) software program eases the design of environment friendly, low-power ICs. Seamlessly built-in with the corporate’s Quantus extraction device, Virtuoso design atmosphere, and Spectre simulator, Voltus-XFi can improve productiveness by as a lot as 3 times versus present options.
The transistor-level EM-IR device delivers foundry-supported SPICE-level accuracy for energy integrity signoff. It permits engineers to extract, simulate, analyze, and debug IC designs. Additional, the intuitive EM-IR outcomes browser lets customers view violations, zoom into areas of curiosity, and overlay ends in the Virtuoso atmosphere, enabling simple identification and violation restore.
Teamed with Cadence’s Voltus IC energy integrity resolution, Voltus-XFi has entry to a seamless move for full-chip signoff verification. It creates a power-grid-view macro mannequin of the analyzed transistor block/IP and passes the mannequin to Voltus IC. The voltage-based technique gives a smaller reminiscence footprint and runs quicker than the trade’s typical current-based technique. This feature routinely balances accuracy and efficiency tradeoffs based mostly on person specs.
“Cadence’s Voltus-XFi resolution elevated our designer productiveness by over 3X in figuring out and fixing EM-IR issues”, stated Alan Poon, vp engineering at The Six Semiconductor. “We sit up for deploying the answer to speed up our design closure.”
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